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SEM-EDX (Scanning Electron Microscopy with Energy-Dispersive X-ray analysis)

A technique combining high-resolution surface imaging with elemental composition analysis; used to compare metallic-flake elemental ratios in OVI ink and to measure surface topography of intaglio ink ridges.

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3-D surface profilometry365 nm UV lampBleached-genuine counterfeitCounterfeit Currency Database (CCD)CVPC (Currency Verification Processing Centre)FTIR spectroscopy (Fourier Transform Infrared)Iodine-starch testRaman spectroscopySupernote

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