FIB (Focused Ion Beam)
A technique using a focused gallium ion beam to mill a specimen at a specific site-selected location, producing a TEM-quality cross-section with nanometre precision from a defined point in the bulk material.
A technique using a focused gallium ion beam to mill a specimen at a specific site-selected location, producing a TEM-quality cross-section with nanometre precision from a defined point in the bulk material.
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